83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . HLUPTG}@;O The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Each channel can provide up to 80V and 10 amps. User-specific tests are programmed with test methods in C. Links are . Advantest. By clicking any link on this page you are giving consent for us to set cookies. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. 0000009007 00000 n In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. (Cut outs impact deflection/rigidity properties). Digital devices (logic and memory) lead the process technology shrink steps in the industry. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. Click on more information for further details. 0000014977 00000 n All features and performance points are available in all classes. T2000. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. %PDF-1.4 % Click on more information for further details. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Pin configuration setup of levels, timing, and vectors. 0000061958 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000031852 00000 n Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. 0000006892 00000 n 3DIC test software development, integration and maintenance. Training needs are limited due to a single, familiar test system. 0000007396 00000 n Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000006289 00000 n By clicking any link on this page you are giving consent for us to set cookies. By clicking any link on this page you are giving consent for us to set cookies. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 0000018675 00000 n 0000029728 00000 n Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Floating VI Source for High Power Applications. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. 0000007267 00000 n testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. 0000002809 00000 n Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 11 0 obj <> endobj xref 11 73 0000000016 00000 n The user benefits are reduced test time, best repeatability and simplified program creation. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. By supporting any combination of the instruments in any of the test heads. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of The platform has become the all purpose reference platform. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Calibration, test flow, test methods, debbuging tools, and concepts. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. Powered by . After completion the student will be familiar with the following: Advantest Corporation 0000079718 00000 n 0000007890 00000 n ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Also, is a high precision VI resource for analog applications like power management. 0000031694 00000 n Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. It improves throughput while maintaining compatibility with the established MBAV8 instrument. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. 0000009749 00000 n 0000007336 00000 n Advantest Corporation Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The platform has become the all purpose reference platform. 0000237580 00000 n Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. DC testing Shmoo tools, data logging, and histograms. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. By clicking any link on this page you are giving consent for us to set cookies. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The more that could be run in parallel, the greater the test time savings. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. 0000033307 00000 n Click on more information for further details. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. In the past, RF parts were separate, individual "jelly bean" parts. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. V93000 Visionary and Enduring Architecture. Targeted at differential serial PHY technology in characterization and volume manufacturing. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. More information is available at www.advantest.com Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. 0000011255 00000 n Engineering time is reduced through test program reuse. 0000031783 00000 n The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications 0000058497 00000 n Agenda www.chiptest.in 3. TEAM A.T.E. Universal Analog Pin covers widest application range. Extends Highly Parallel Testing Capabilities. Click on more information for further details. 0000009606 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. 0000332614 00000 n 0000058071 00000 n Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. 0000059227 00000 n The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. 0000349795 00000 n With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any .

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